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Quantification of dissipation and deformation in ambient atomic force microscopy
dc.contributor.author | Santos Hernández, Sergio |
dc.contributor.author | Gadelrab,, K. |
dc.contributor.author | Barcons Xixons, Víctor |
dc.contributor.author | Stefancich, M. |
dc.contributor.author | Chiesa, Matteo |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics |
dc.date.accessioned | 2012-10-16T08:18:07Z |
dc.date.created | 2012-07-20 |
dc.date.issued | 2012-07-20 |
dc.identifier.citation | Santos, S. [et al.]. Quantification of dissipation and deformation in ambient atomic force microscopy. "New journal of physics", 20 Juliol 2012, vol. 14, p. 1-12. |
dc.identifier.issn | 1367-2630 |
dc.identifier.uri | http://hdl.handle.net/2117/16725 |
dc.description.abstract | A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample deformation with picometer resolution. |
dc.format.extent | 12 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Física |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Atomic force microscopy |
dc.subject.other | Dissipative process |
dc.subject.other | Energy hysteresis |
dc.subject.other | Picometer resolution |
dc.subject.other | Sample deformation |
dc.subject.other | Unknown quantity |
dc.title | Quantification of dissipation and deformation in ambient atomic force microscopy |
dc.type | Article |
dc.subject.lemac | Microscòpia de força atòmica |
dc.contributor.group | Universitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control |
dc.identifier.doi | 10.1088/1367-2630/14/7/073044 |
dc.relation.publisherversion | http://iopscience.iop.org/1367-2630/14/7/073044 |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 10911979 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Santos, S.; Gadelrab,, K.; Barcons, V.; Stefancich, M.; Chiesa, M. |
local.citation.publicationName | New journal of physics |
local.citation.volume | 14 |
local.citation.startingPage | 1 |
local.citation.endingPage | 12 |
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