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A formalism to extract and quantify unknown quantities such as
sample deformation, the viscosity of the sample and surface energy hysteresis
in amplitude modulation atomic force microscopy is presented. Recovering
the unknowns only requires the cantilever to be accurately calibrated and the
dissipative processes occurring during sample deformation to be well modeled.
The theory is validated by comparison with numerical simulations and shown
to be able to provide, in principle, values of sample deformation with picometer
CitationSantos, S. [et al.]. Quantification of dissipation and deformation in ambient atomic force microscopy. "New journal of physics", 20 Juliol 2012, vol. 14, p. 1-12.
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