PublisherIEEE Press. Institute of Electrical and Electronics Engineers
Rights accessRestricted access - publisher's policy
Process variations and device aging have a significant
impact on the reliability and performance of nano scale
integrated circuits. Proactive reconfiguration is an emerging
technique to extend the lifetime of embedded SRAM memories.
This work introduces a novel version that modifies and enhances
the advantages of this method by considering the process
variability impact on the memory components. Our results show
between 30% and 45% SRAM lifetime increases over the
existing proactive reconfiguration technique and between 1.7X
and ~10X improvement over the non-proactive reconfiguration.
CitationRubio, J.A.; Amat, E.; Pouyan, P. Process variability-aware proactive reconfiguration techniques for mitigating aging effects in nano scale SRAM lifetime. A: VLSI Test Symposium. "Proceedings of the VLSI Test Symposium". Hawaii: IEEE Press. Institute of Electrical and Electronics Engineers, 2012, p. 240-245.
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