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dc.contributor.authorFont Teixidó, Josep
dc.contributor.authorSantos Hernández, Sergio
dc.contributor.authorBarcons Xixons, Víctor
dc.contributor.authorThomson, Neil H.
dc.contributor.authorVerdaguer, Albert
dc.contributor.authorChiesa, Matteo
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
dc.date.accessioned2012-04-27T15:40:55Z
dc.date.available2013-04-27T23:30:58Z
dc.date.created2012-01-26
dc.date.issued2012-01-26
dc.identifier.citationFont, J. [et al.]. Spatial horizons in amplitude and frequency modulation atomic force microscopy. "Nanoscale", 26 Gener 2012, vol. 7, núm. 4, p. 2463-2469.
dc.identifier.issn2040-3364
dc.identifier.urihttp://hdl.handle.net/2117/15767
dc.description.abstractIn dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation (AM and FM) atomic force microscopy have established themselves as the most powerful, robust and reliable techniques in the field. Nevertheless, it is still debatable whether one or the other technique is preferred in a given medium or experiment. Here, we quantitatively establish the limitations in resolution of one and the other technique by introducing the concept of space horizon SH and quantifying it. The SH is the limiting space boundary beyond which collective atomic interactions do not affect the detection parameters of a given feedback system. We show that while an FM feedback can resolve an atom where an AM feedback might fail, relative contrast is in fact equivalent for both feedback systems. That is, if the AM feedback could detect sufficiently small amplitude shifts and there was no noise, single atom imaging would be equivalent in AM and FM.
dc.format.extent7 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshAtomic force microscopy
dc.subject.lcshModulation (Electronics)
dc.titleSpatial horizons in amplitude and frequency modulation atomic force microscopy
dc.typeArticle
dc.subject.lemacMicroscòpia de força atòmica
dc.subject.lemacModulació (Electrònica)
dc.contributor.groupUniversitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control
dc.identifier.doi10.1039/c2nr12012g
dc.rights.accessOpen Access
local.identifier.drac10221319
dc.description.versionPostprint (published version)
local.citation.authorFont, J.; Santos, S.; Barcons, V.; Thomson, N.; Verdaguer, A.; Chiesa, M.
local.citation.publicationNameNanoscale
local.citation.volume7
local.citation.number4
local.citation.startingPage2463
local.citation.endingPage2469


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