Evaluation of titanium dental implants after failure of osseointegration by means of X-ray photoelectron spectroscopy, electron microscopy and histological studies
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hdl:2117/15147
Tipus de documentArticle
Data publicació2010
EditorSpringer
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Reconeixement-NoComercial-SenseObraDerivada 3.0 Espanya
Abstract
In this work, we analysed 56 clinically failed and retrieved
implants by means of scanning electron microscopy
(SEM), X-ray photoelectron spectroscopy
(XPS) and histological studies. The surface contamination
was compared to that of unused control implants
and with that of the same implants after
cleaning in a basic medium. The surfaces of the unused
implants presented considerable contamination.
In particular, high levels of carbon were detected.
The nature of this C was elucidated by XPS analysis
of the lubricant used in the machining process. The
same contamination was observed in the retrieved
implants. Histological studies were carried out by
means of light microscopy. Fibrosis and granulomatous
lesions were detected in the tissues. XPS analysis
indicated the presence of traces of other elements (Na,
Ca, Zn, S, F, etc.) that were not related to impurities
in cpTi. We examined a cleaning process in a basic
medium that eliminates the organic components of
the implant surfaces. The cleaned implants were implanted
in the patients and the results were excellent.
None of the implants failed in following 7 months.
CitacióLázaro, P.; Herrero-Climent, M.; Gil, F.J. Evaluation of titanium dental implants after failure of osseointegration by means of X-ray photoelectron spectroscopy, electron microscopy and histological studies. "Journal of Biomedical Science and Engineering", 2010, vol. 3, núm. 11, p. 1073-1077.
ISSN1423-0127
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