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8T SRAM Cell with Open Defects under Voltage and Timing Variations
| dc.contributor.author | Rodríguez Montañés, Rosa |
| dc.contributor.author | Arumi Delgado, Daniel |
| dc.contributor.author | Figueras Pàmies, Joan |
| dc.contributor.author | Castillo Muñoz, Raul |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2012-01-17T12:01:26Z |
| dc.date.available | 2012-01-17T12:01:26Z |
| dc.date.created | 2011 |
| dc.date.issued | 2011 |
| dc.identifier.citation | Rodríguez-Montañés, R. [et al.]. 8T SRAM Cell with Open Defects under Voltage and Timing Variations. A: Conference on Design of Circuits and Integrated Systems. "DCIS 2011". Albufeira: 2011, p. 155-160. |
| dc.identifier.uri | http://hdl.handle.net/2117/14597 |
| dc.format.extent | 6 p. |
| dc.language.iso | eng |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.title | 8T SRAM Cell with Open Defects under Voltage and Timing Variations |
| dc.type | Conference report |
| dc.subject.lemac | Memòria cau |
| dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
| dc.rights.access | Open Access |
| local.identifier.drac | 9368433 |
| dc.description.version | Postprint (published version) |
| local.citation.author | Rodríguez-Montañés, R.; Arumi, D.; Figueras, J.; Castillo, R. |
| local.citation.contributor | Conference on Design of Circuits and Integrated Systems |
| local.citation.pubplace | Albufeira |
| local.citation.publicationName | DCIS 2011 |
| local.citation.startingPage | 155 |
| local.citation.endingPage | 160 |
