PublisherIEEE Press. Institute of Electrical and Electronics Engineers
Rights accessRestricted access - publisher's policy
Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are
considered and the analysis is carried out under single-device and two-simultaneous-device faults. Switching strategies to
overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC prototype are presented to validate the analysis.
CitationNicolas, J. [et al.]. Fault-tolerance capacity of the multilevel active-clamped topology. A: IEEE Energy Conversion Congress and Exposition. "3rd Annual IEEE Energy Conversion Congress & Exposition". Phoenix, AR: IEEE Press. Institute of Electrical and Electronics Engineers, 2011, p. 3411-3418.
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