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Títol: Fault-tolerance capacity of the multilevel active-clamped topology
Autor: Nicolás Apruzzese, Joan
Busquets Monge, Sergio
Bordonau Farrerons, José
Alepuz Menéndez, Salvador
Calle Prado, Alejandro
Altres autors/autores: Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
Editorial: IEEE Press. Institute of Electrical and Electronics Engineers
Matèries: Àrees temàtiques de la UPC::Enginyeria electrònica i telecomunicacions::Electrònica de potència
MAC topology
Multilevel converters
Topologia MAC
Tipus de document: Conference report
Descripció: Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered and the analysis is carried out under single-device and two-simultaneous-device faults. Switching strategies to overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC prototype are presented to validate the analysis.
Altres identificadors i accés: Nicolas, J. [et al.]. Fault-tolerance capacity of the multilevel active-clamped topology. A: IEEE Energy Conversion Congress and Exposition. "3rd Annual IEEE Energy Conversion Congress & Exposition". Phoenix, AR: IEEE Press. Institute of Electrical and Electronics Engineers, 2011, p. 3411-3418.
http://hdl.handle.net/2117/13987
10.1109/ECCE.2011.6064230
Disponible al dipòsit:E-prints UPC
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