Optical measurements on GaAs(Ti) thin films sputtered on GaAs
Document typeConference report
Rights accessRestricted access - publisher's policy
Some sputtering processes of GaAs(Ti) onto c-GaAs have been carried out in order to obtain thin films as candidates to be intermediate band photovoltaic materials. This work presents the results obtained in the study of the absorptance, from transmittance and reflectance responses, in samples obtained at different conditions of temperature and power during the sputtering deposition.
CitationBoronat, A.; Silvestre, S.; Castañer, L. Optical measurements on GaAs(Ti) thin films sputtered on GaAs. A: Spanish Conference on Electron Devices. "8th Spanish Conference on Electron Devices". Palma de Mallorca: 2011, p. 1-3.