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Defective Behaviour of an 8T SRAM Cell with Open Defects
dc.contributor.author | Rodríguez Montañés, Rosa |
dc.contributor.author | Arumi Delgado, Daniel |
dc.contributor.author | Manich Bou, Salvador |
dc.contributor.author | Figueras Pàmies, Joan |
dc.contributor.author | Di Carlo, Stefano |
dc.contributor.author | Prinetto, Paolo |
dc.contributor.author | Scionti, Alberto |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics |
dc.date.accessioned | 2011-03-21T13:55:57Z |
dc.date.available | 2011-03-21T13:55:57Z |
dc.date.created | 2010 |
dc.date.issued | 2010 |
dc.identifier.citation | Rodríguez, R. [et al.]. Defective Behaviour of an 8T SRAM Cell with Open Defects. A: International Conference on Advances in System Testing and Validation Lifecycle. "Second International Conference on Advances in System Testing and Validation Lifecycle". Niça: 2010, p. 81-86. |
dc.identifier.isbn | 978-1-4244-7784-5 |
dc.identifier.uri | http://hdl.handle.net/2117/11989 |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Electronic engineering |
dc.title | Defective Behaviour of an 8T SRAM Cell with Open Defects |
dc.type | Conference report |
dc.subject.lemac | Nanotecnologia |
dc.subject.lemac | Enginyeria electrònica -- Congressos |
dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.identifier.doi | 10.1109/VALID.2010.19 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5617198 |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 5377811 |
dc.description.version | Postprint (published version) |
local.citation.author | Rodríguez, R.; Arumi, D.; Manich, S.; Figueras, J.; Stefano Di Carlo; Paolo Prinetto; Scionti, A. |
local.citation.contributor | International Conference on Advances in System Testing and Validation Lifecycle |
local.citation.pubplace | Niça |
local.citation.publicationName | Second International Conference on Advances in System Testing and Validation Lifecycle |
local.citation.startingPage | 81 |
local.citation.endingPage | 86 |