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Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS
| dc.contributor.author | Vatajelu, Elena Ioana |
| dc.contributor.author | Renovell, Michel |
| dc.contributor.author | Figueras Pàmies, Joan |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2011-03-18T14:50:03Z |
| dc.date.available | 2011-03-18T14:50:03Z |
| dc.date.created | 2010 |
| dc.date.issued | 2010 |
| dc.identifier.citation | Vatajelu, E.; Renovell, M.; Figueras, J. Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS. A: International Workshop on the Impact of Low Power design on Test and Reliability(LPonTR). "LPonTR'10 - International Workshop on the Impact of Low Power design on Test and Reliability". Praga: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 1-3. |
| dc.identifier.uri | http://hdl.handle.net/2117/11964 |
| dc.format.extent | 3 p. |
| dc.language.iso | eng |
| dc.publisher | IEEE Press. Institute of Electrical and Electronics Engineers |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.subject.lcsh | Electronic engineering |
| dc.title | Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS |
| dc.type | Conference report |
| dc.subject.lemac | Enginyeria electrònica -- Congressos |
| dc.contributor.group | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
| dc.description.peerreviewed | Peer Reviewed |
| dc.rights.access | Restricted access - publisher's policy |
| local.identifier.drac | 5331279 |
| dc.description.version | Postprint (author’s final draft) |
| local.citation.author | Vatajelu, E.; Renovell, M.; Figueras, J. |
| local.citation.contributor | International Workshop on the Impact of Low Power design on Test and Reliability(LPonTR) |
| local.citation.pubplace | Praga |
| local.citation.publicationName | LPonTR'10 - International Workshop on the Impact of Low Power design on Test and Reliability |
| local.citation.startingPage | 1 |
| local.citation.endingPage | 3 |