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Transient FDTD simulation validation
| dc.contributor.author | Jauregui Tellería, Ricardo |
| dc.contributor.author | Riu Costa, Pere Joan |
| dc.contributor.author | Silva Martínez, Fernando |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2011-01-13T10:36:18Z |
| dc.date.available | 2011-01-13T10:36:18Z |
| dc.date.created | 2010 |
| dc.date.issued | 2010 |
| dc.identifier.citation | Jauregui, R.; Riu, P.; Silva, F. Transient FDTD simulation validation. A: International Symposium on Electromagnetic Compatibility. "IEEE International Symposium on Electromagnetic Compatibility". Fort Lauderdale: 2010, p. 1-6. |
| dc.identifier.isbn | 978-1-4244-6307-7 |
| dc.identifier.uri | http://hdl.handle.net/2117/11000 |
| dc.description.abstract | In computational electromagnetic simulations, most validation methods have been developed until now to be used in the frequency domain. However, the EMC analysis of the systems in the frequency domain many times is not enough to evaluate the immunity of current communication devices. Based on several studies, in this paper we propose an alternative method of validation of the transients in time domain allowing a rapid and objective quantification of the simulations results. |
| dc.format.extent | 6 p. |
| dc.language.iso | eng |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.subject.lcsh | Electromagnetic compatibility |
| dc.subject.lcsh | Finite differences |
| dc.subject.lcsh | Transients (Electricity)--Electromechanical analogies |
| dc.subject.lcsh | Electronic engineering |
| dc.title | Transient FDTD simulation validation |
| dc.type | Conference report |
| dc.subject.lemac | Transistors |
| dc.subject.lemac | Enginyeria electrònica |
| dc.contributor.group | Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica |
| dc.rights.access | Open Access |
| local.identifier.drac | 3336243 |
| dc.description.version | Postprint (published version) |
| local.citation.author | Jauregui, R.; Riu, P.; Silva, F. |
| local.citation.contributor | International Symposium on Electromagnetic Compatibility |
| local.citation.pubplace | Fort Lauderdale |
| local.citation.publicationName | IEEE International Symposium on Electromagnetic Compatibility |
| local.citation.startingPage | 1 |
| local.citation.endingPage | 6 |
