New Theoretical Analysis of the LRRM Calibration Technique for Vector Network Analyzers
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Rights accessOpen Access
In this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) vector network-analyzer (VNA) calibration technique is presented. As a result, it is shown that the reference-impedance (to which the LRRM calibration is referred) cannot generally be defined whenever nonideal standards are used. Based on this consideration, a new algorithm to determine the on-wafer match standard is proposed that improves the LRRM calibration accuracy. Experimental verification of the new theory and algorithm using on-wafer calibrations up to 40 GHz is given.
CitationPurroy, F; Pradell, L. New theoretical analysis of the LRRM calibration technique for vector network analyzers. IEEE Transactions on instrumentation and measurement, 2001, vol.50, núm.5, p.1307-1314
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