This work describes and compares two alternative methods of analyzing dielectric-loaded cavities for measurement of intermodulation distortion in HTS films. One of them is based on assuming a specific type of HTS nonlinearities and developing theoretical equations based on them. The second is based on a numerical approach that can be applied to many types of nonlinearities. Both methods are shown to work on measured data of representative HTS films.
CitationCollado, C.; Mateu, J.; Menendez, O.; O'Callaghan, J. M. Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors. IEEE Transactions on applied superconductivity, 2003, vol. 13, núm. 2, p. 332-335.
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