This work describes and compares two alternative methods of analyzing dielectric-loaded cavities for measurement of intermodulation distortion in HTS films. One of them is based on assuming a specific type of HTS nonlinearities and developing theoretical equations based on them. The second is based on a numerical approach that can be applied to many types of nonlinearities. Both methods are shown to work on measured data of representative HTS films.
CitationCollado, C.; Mateu, J.; Menendez, O.; O'Callaghan, J. M. Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors. IEEE Transactions on applied superconductivity, 2003, vol. 13, núm. 2, p. 332-335.
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder. If you wish to make any use of the work not provided for in the law, please contact: firstname.lastname@example.org