In this presentation we cover how to use low frequency
or DC temperature measurements to observe figures of merit of
high frequency analogue circuits.
CitationAltet, J.; Mateo, D.; Aldrete, H. Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits. A: IEEE International On-Line Testing Symposium. "16th IEEE International On-Line Testing Symposium". Corfú: 2010, p. 135.
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