Hot spot detection in integrated circuits laterally accessing to their substrate using a laser beam
Document typeConference report
PublisherIEEE Computer Society Publications
Rights accessOpen Access
In this paper we present an electro-thermal coupling simulation technique for RF circuits. The proposed methodology takes advantage of well established tools for frequency translating circuits in order to significantly reduce the computational resources needed when frequencies of interest are separated by orders of magnitude.
CitationPerpiñà, X. [et al.]. Hot spot detection in integrated circuits laterally accessing to their substrate using a laser beam. A: 16th International workshop on Thermal investigations of ICs and Systems. "16th THERMINIC". Barcelona: IEEE Computer Society Publications, 2010, p. 117-121.