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dc.contributor.authorIgelmo Ganzo, Manuel
dc.contributor.authorSanfeliu Cortés, Alberto
dc.contributor.authorFerrer Sumsi, Miquel
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria de Sistemes, Automàtica i Informàtica Industrial
dc.contributor.otherInstitut de Robòtica i Informàtica Industrial
dc.date.accessioned2010-12-02T19:09:08Z
dc.date.available2010-12-02T19:09:08Z
dc.date.created2010
dc.date.issued2010
dc.identifier.citationIgelmo, M.; Sanfeliu, A.; Ferrer, M. A conductance electrical model for representing and matching weighted undirected graphs. A: International Conference on Pattern Recognition. "20th International Conference on Pattern Recognition". 2010, p. 958-961.
dc.identifier.urihttp://hdl.handle.net/2117/10494
dc.description.abstractIn this paper we propose a conductance electrical model to represent weighted undirected graphs that allows us to efficiently compute approximate graph isomorphism in large graphs. The model is built by transforming a graph into an electrical circuit. Edges in the graph become conductances in the electrical circuit. This model follows the laws of the electrical circuit theory and we can potentially use all the existing theory and tools of this field to derive other approximate techniques for graph matching. In the present work, we use the proposed circuital model to derive approximated graph isomorphism solutions.
dc.format.extent4 p.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Matemàtiques i estadística::Anàlisi numèrica::Modelització matemàtica
dc.subject.lcshMathematical models
dc.subject.otherpattern recognition PARAULES AUTOR: graph isomorphism
dc.subject.otherconductance electrical model
dc.subject.otherweigthed undirected graphs
dc.titleA conductance electrical model for representing and matching weighted undirected graphs
dc.typeConference report
dc.subject.lemacModelització matemàtica
dc.contributor.groupUniversitat Politècnica de Catalunya. VIS - Visió Artificial i Sistemes Intel·ligents
dc.identifier.doi10.1109/ICPR.2010.240
dc.description.peerreviewedPeer Reviewed
dc.subject.inspecClassificació INSPEC::Modelling
dc.relation.publisherversionhttp://dx.doi.org/10.1109/ICPR.2010.240
dc.rights.accessOpen Access
local.identifier.drac4400705
dc.description.versionPostprint (published version)
local.citation.authorIgelmo, M.; Sanfeliu, A.; Ferrer, M.
local.citation.contributorInternational Conference on Pattern Recognition
local.citation.publicationName20th International Conference on Pattern Recognition
local.citation.startingPage958
local.citation.endingPage961


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