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Microwave noise parameter measurements of a high temperature superconducting flux flow transistor
dc.contributor.author | O'Callaghan Castellà, Juan Manuel |
dc.contributor.author | Martens, J. S. |
dc.contributor.author | Thompson, J. H. |
dc.contributor.author | Beyer, J. B. |
dc.contributor.author | Nordman, J. E. |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
dc.date.accessioned | 2007-05-21T11:52:26Z |
dc.date.available | 2007-05-21T11:52:26Z |
dc.date.created | 1990 |
dc.date.issued | 1991-02-28 |
dc.identifier.citation | O'Callaghan, J. M.; Martens, J. S.; Thompson, J. M.; Beyer, J. B.; Nordman, J. E. Microwave noise parameter measurements of a high temperature superconducting flux flow transistor. IEEE Transactions on magnetics, 1991, vol. 27, núm. 2, p. 3289-3292. |
dc.identifier.issn | 0018-9464 |
dc.identifier.uri | http://hdl.handle.net/2117/1016 |
dc.description.abstract | The noise parameters of a high-temperature superconducting (HTS) flux flow transistor made of TlBaCaCuO operating at 77 K and 3-5 GHz were experimentally determined. It is assumed that the dominant noise mechanism of the device, which is based on an array of weak links with a magnetic control line, is due to the statistical nature of flux nucleation and motion in the links. The noise parameters dictate the dependence of the noise figure on the source impedance, and are calculated by measuring source impedances. Sensitivity analysis is used to estimate the accuracy of the measurements. The measurements indicate a minimum noise figure of less than 1 dB at 3 GHz. |
dc.format.extent | 3289-3292 |
dc.language.iso | eng |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
dc.subject.lcsh | High temperature superconductors |
dc.subject.lcsh | Microwave measurements |
dc.subject.other | barium compounds |
dc.subject.other | calcium compounds |
dc.subject.other | electric noise measurement |
dc.subject.other | electron device noise |
dc.subject.other | flux flow |
dc.subject.other | high-temperature superconductors |
dc.subject.other | microwave measurement |
dc.subject.other | superconducting junction devices |
dc.subject.other | thallium compounds |
dc.title | Microwave noise parameter measurements of a high temperature superconducting flux flow transistor |
dc.type | Article |
dc.subject.lemac | Superconductors a altes temperatures |
dc.subject.lemac | Microones -- Mesurament |
dc.contributor.group | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
dc.description.peerreviewed | Peer Reviewed |
dc.rights.access | Open Access |
local.personalitzacitacio | true |
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