Filtering graphs to check isomorphism and extracting mapping by using the Conductance Electrical Model
10.1016/j.patcog.2016.03.015
Inclou dades d'ús des de 2022
Cita com:
hdl:2117/101467
Tipus de documentArticle
Data publicació2016-10-01
Condicions d'accésAccés obert
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continguts d'aquesta obra estan subjectes a la llicència de Creative Commons
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Reconeixement-NoComercial-SenseObraDerivada 3.0 Espanya
ProjecteINTERACCION, APRENDIZAJE Y COOPERACION ROBOT ? HUMANO EN AREAS URBANAS (MINECO-DPI2013-42458-P)
Abstract
This paper presents a new method of filtering graphs to check exact graph isomorphism and extracting their mapping. Each graph is modeled by a resistive electrical circuit using the Conductance Electrical Model (CEM). By using this model, a necessary condition to check the isomorphism of two graphs is that their equivalent resistances have the same values, but this is not enough, and we have to look for their mapping to find the sufficient condition. We can compute the isomorphism between two graphs in O(N-3), where N is the order of the graph, if their star resistance values are different, otherwise the computational time is exponential, but only with respect to the number of repeated star resistance values, which usually is very small. We can use this technique to filter graphs that are not isomorphic and in case that they are, we can obtain their node mapping. A distinguishing feature over other methods is that, even if there exists repeated star resistance values, we can extract a partial node mapping (of all the nodes except the repeated ones and their neighbors) in O(N-3). The paper presents the method and its application to detect isomorphic graphs in two well know graph databases, where some graphs have more than 600 nodes. (C) 2016 Elsevier Ltd. All rights reserved.
Descripció
© 2016. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
CitacióIgelmo, M., Sanfeliu, A. Filtering graphs to check isomorphism and extracting mapping by using the Conductance Electrical Model. "Pattern recognition", 1 Octubre 2016, vol. 58, p. 68-82.
ISSN0031-3203
Versió de l'editorhttp://www.sciencedirect.com/science/article/pii/S0031320316001102
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