DSpace DSpace UPC
 Català   Castellano   English  

E-prints UPC >
Enginyeria electrònica i telecomunicacions >
QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades >


QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades

Ponències/Comunicacions de congressos : [50]

Cerca a aquesta col·lecció:


 




Llista per 
Subscriviu-vos per rebre un correu electrònic cada vegada que s'introdueixi un nou ítem en aquesta col·lecció.
Vista preliminarDataTítolAutor(s)
2014A low area probing detector for power efficient security ICsWeiner, Michael; Manich Bou, Salvador; Sigl, Georg
2014Post-Bond test of through-silicon vias with open defectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan
2014Interleaved Scrambling Technique: A Novel Low-Power Security Layer for Cache MemoriesNeagu, Madalin; Manich Bou, Salvador; Miclea, Liviu
2014A low area probing detector for security IC'sWeiner, Michael; Manich Bou, Salvador; Sigl, Georg
2013M-S test based on specification validation using octrees in the measure spaceGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2013Nondestructive diagnosis of mechanical misalignments in dual axis accelerometersGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
dcis2013.pdf.jpg2013Test of dual axis accelerometers based on specifications complianceGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2013Differential scan-path: A novel solution for secure design-for-testabilityManich Bou, Salvador; Wamser, Markus S.; Guillen, Oscar M.; Sigl, Georg
2013Improving the security of scan path test using differential chainsManich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
2013Information Leakage Reduction at the Scan-Path OutputManich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
2013BIST Architecture to Detect Defects in TSVs During Pre-Bond TestingArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan
dcis2012.pdf.jpg2012SRAM stability metric under transient noiseVatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
dcis2012.pdf.jpg2012Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
dcis2011.pdf.jpg20118T SRAM Cell with Open Defects under Voltage and Timing VariationsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Castillo Muñoz, Raul
DCIS_2011.pdf.jpg2011Maximum IR-drop in On-Chip Power Distribution Networks of Wire-Bonded Integrated CircuitsRius Vázquez, José; Aguareles Carrero, María
2011Transient noise failures in SRAM cells: dynamic noise margin metricVatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
2011Testing IC accelerometers using Lissajous compositionsGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2011Identification of component deviations in analog circuits using digital signaturesGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
2011CLIL implementation at a Spanish university: A pilot experienceAguilar Pérez, Marta; Rodríguez Montañés, Rosa; Oriol, Carlos
INSS10_FORMATTED.pdf.jpg15-jun-2010Two-Dimensional Communication of Networked Devices Through a Single Conductive SurfaceRius Vázquez, José
ets10_15_2.pdf.jpg24-mai-2010Diagnosis of full open defects in interconnect lines with fan-outArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, C.; Kruseman, Bram
2010Parametric Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic AnalysisVatajelu, Elena Ioana; Panagopoulos, Georgios; Roy, Kaushik; Figueras Pàmies, Joan
2010Defective Behaviour of an 8T SRAM Cell with Open DefectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador; Figueras Pàmies, Joan; Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto
IP5_06.pdf.jpg2010Analog circuit test based on a digital signatureGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
2010A Single Conductive Surface as Communication Media for Networked DevicesRius Vázquez, José
2010Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVSVatajelu, Elena Ioana; Renovell, Michel; Figueras Pàmies, Joan
2010Statistical analysis of SRAM aarametric failure under supply voltage scalingVatajelu, Elena Ioana; Figueras Pàmies, Joan
digital signature generator.pdf.jpg2009Digital signature generator for mixed-signal testingSanahuja Moliner, Ricard; Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
p102.pdf.jpg2009Verifying analog circuits based on a digital signatureGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
getPDF.pdf.jpg31-mai-2007Diagnosis of full open defects in interconnecting linesRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram; Lousberg, M.; Majhi, A.K.
IEEE_ASS_06.pdf.jpg2006Adapted importance sampling schemes for the simulation of dependability models of Fault-tolerant systems with deferred repairCarrasco, Juan A.
IEEE_DSN_03b.pdf.jpg2003A combinatorial method for the evaluation of yield of fault-tolerant systems-on-chipSuñé, Víctor; Rodríguez Montañés, Rosa; Carrasco, Juan A.; Munteanu, D-P
IEEE_DSN_03a.pdf.jpg2003Validation of aproximate dependability models of a RAID architecture with orthogonal organizationCarrasco, Juan A.
COMM_02.pdf.jpg2002Markovian reliability analysis of non-coherent non-repairable fault-tolerant interconnection networksCarrasco, Juan A.; Suñé, Víctor; Rincu, C-I
IEEE_MASCOTS_99.pdf.jpg1999Failure distance based bounds for steady-state availability without the kwnowledge of minimal cutsSuñé, Víctor; Carrasco, Juan A.
IEEE_IPDS_98.pdf.jpg1998Bounding steady-state availability models with phase type repair distributionsCarrasco, Juan A.
LNCS_98.pdf.jpg1998A comparison of numerical splitting-based methods for Markovian dependability and performability modelsSuñé, Víctor; Carrasco, Juan A.
IEEE_MASCOTS_97.pdf.jpg1997A method for the computation of reliability bounds for non-repairable fault-tolerant systemsSuñé, Víctor; Carrasco, Juan A.
DCIS_97.pdf.jpg1997METFAC-2: A tool for specification and solution of Markov performance, dependability and performability modelsCarrasco, Juan A.; Domingo Fuster, José Luis
IEEE_MASCOTS_96.pdf.jpg1996Two new algorithms to compute steady-state bounds for Markov models with slow forward and fast backward transitionsCarrasco, Juan A.; Calderón, A; Escribà, J
IEEE_DAC_95.pdf.jpg1995Synthesis of IDDQ-Testable Circuits: Integrating Built-in Current SensorsWunderlich, H J; Herzog, M; Figueras Pàmies, Joan; Carrasco, Juan A.; Calderón, A
IEEE_IPDS_95.pdf.jpg1995Computation of absorption probability distributions of continuous-time Markov chains using regenerative randomizationCarrasco, Juan A.; Calderón, A
DCCA_95.pdf.jpg1994Improving availability bounds using the failure distance conceptCarrasco, Juan A.
CPE_92.pdf.jpg1992Failure distance-based simulation of repairable fault-tolerant systemsCarrasco, Juan A.
IEEE_RDS_91.pdf.jpg1991Efficient transient simulation of failure/repair markovian modelsCarrasco, Juan A.
IEEE_AEC_91.pdf.jpg1991Hierarchical object-oriented modeling of fault-tolerant computer systemsCarrasco, Juan A.
ESPRIT_89.pdf.jpg31-des-1989Project nº 1609: System measurement and architecture techniques (SMART)Crowe, M K; Carrasco, Juan A.
IEEE_PNPM_89.pdf.jpg1989Automated construction of compound Markov chains from generalized stochastic high-level Petri netsCarrasco, Juan A.
IAESTED_87.pdf.jpg1987Analysis of sparse numerical methods for dependability evaluationCarrasco, Juan A.
ISMM_85.pdf.jpg1985Structural and functional fault-tolerance evaluation of local area networksCarrasco, Juan A.; Figueras Pàmies, Joan

 

Valid XHTML 1.0! Programari DSpace Copyright © 2002-2004 MIT and Hewlett-Packard Comentaris
Universitat Politècnica de Catalunya. Servei de Biblioteques, Publicacions i Arxius