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QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades >


QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades

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Vista preliminarDataTítolAutor(s)
paperTRUEDEVICE Workshop - 24022015.pdf.jpg2015On the use of error detecting and correcting codes to boost security in caches against side channel attacksNeagu, Madalin; Miclea, Liviu; Manich Bou, Salvador
2014Reliability estimation at block-level granularity of spin-transfer-torque MRAMsDi Carlo, Stefano; Indaco, Marco; Prinetto, Paolo; Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan
dcis2014_submission_11.pdf.jpg2014Defeating microprobing attacks using a resource efficient detection circuitWeiner, Michael; Manich Bou, Salvador; Sigl, Georg
2014Criteria for indirect measurements in M-S testingGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2014Post-Bond test of through-silicon vias with open defectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan
2014Error resilient real-time state variable systems signal processing and controlBanerjee, Suvadeep; Gómez Pau, Álvaro; Chatterjee, Abhijit; Abraham, Jacob
dcis2014.pdf.jpg2014An efficient behavioral description frontend tool for mixed-mode SPICE simulationGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan; Chatterjee, Abhijit
dcis2014.pdf.jpg2014Quality metrics for mixed-signal indirect testingGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2014Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksumsGómez Pau, Álvaro; Banerjee, Suvadeep; Chatterjee, Abhijit
2014Interleaved Scrambling Technique: A Novel Low-Power Security Layer for Cache MemoriesNeagu, Madalin; Manich Bou, Salvador; Miclea, Liviu
2014A low area probing detector for security IC'sWeiner, Michael; Manich Bou, Salvador; Sigl, Georg
2014Real-time transient error and induced noise cancellation in linear analog filters using learning-asisted adaptive analog checksumsGómez Pau, Álvaro; Banerjee, Suvadeep; Chatterjee, Abhijit
2014A low area probing detector for power efficient security ICsWeiner, Michael; Manich Bou, Salvador; Sigl, Georg
2013M-S test based on specification validation using octrees in the measure spaceGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2013Nondestructive diagnosis of mechanical misalignments in dual axis accelerometersGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
dcis2013.pdf.jpg2013Test of dual axis accelerometers based on specifications complianceGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2013Differential scan-path: A novel solution for secure design-for-testabilityManich Bou, Salvador; Wamser, Markus S.; Guillen, Oscar M.; Sigl, Georg
2013Improving the security of scan path test using differential chainsManich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
2013Information Leakage Reduction at the Scan-Path OutputManich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
2013BIST Architecture to Detect Defects in TSVs During Pre-Bond TestingArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan
dcis2012.pdf.jpg2012SRAM stability metric under transient noiseVatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
dcis2012.pdf.jpg2012Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
2011CLIL implementation at a Spanish university: A pilot experienceAguilar Pérez, Marta; Rodríguez Montañés, Rosa; Oriol, Carlos
DCIS_2011.pdf.jpg2011Maximum IR-drop in On-Chip Power Distribution Networks of Wire-Bonded Integrated CircuitsRius Vázquez, José; Aguareles Carrero, María
2011Transient noise failures in SRAM cells: dynamic noise margin metricVatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
dcis2011.pdf.jpg20118T SRAM Cell with Open Defects under Voltage and Timing VariationsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Castillo Muñoz, Raul
2011Testing IC accelerometers using Lissajous compositionsGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2011Identification of component deviations in analog circuits using digital signaturesGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
INSS10_FORMATTED.pdf.jpg15-jun-2010Two-Dimensional Communication of Networked Devices Through a Single Conductive SurfaceRius Vázquez, José
ets10_15_2.pdf.jpg24-mai-2010Diagnosis of full open defects in interconnect lines with fan-outArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, C.; Kruseman, Bram
24-mai-2010Design and implementation of automatic test equipment IP moduleFransi Palos, Sergi; Farre Lozano, Goretti; Garcia Deiros, Lucas; Manich Bou, Salvador
2010Defective Behaviour of an 8T SRAM Cell with Open DefectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador; Figueras Pàmies, Joan; Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto
2010Parametric Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic AnalysisVatajelu, Elena Ioana; Panagopoulos, Georgios; Roy, Kaushik; Figueras Pàmies, Joan
2010A Method for Detecting Resistive Opens in BusesRius Vázquez, José
2010A Single Conductive Surface as Communication Media for Networked DevicesRius Vázquez, José
2010Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVSVatajelu, Elena Ioana; Renovell, Michel; Figueras Pàmies, Joan
IP5_06.pdf.jpg2010Analog circuit test based on a digital signatureGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
2010Statistical analysis of SRAM aarametric failure under supply voltage scalingVatajelu, Elena Ioana; Figueras Pàmies, Joan
p102.pdf.jpg2009Verifying analog circuits based on a digital signatureGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
digital signature generator.pdf.jpg2009Digital signature generator for mixed-signal testingSanahuja Moliner, Ricard; Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
getPDF.pdf.jpg31-mai-2007Diagnosis of full open defects in interconnecting linesRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram; Lousberg, M.; Majhi, A.K.
IEEE_ASS_06.pdf.jpg2006Adapted importance sampling schemes for the simulation of dependability models of Fault-tolerant systems with deferred repairCarrasco, Juan A.
IEEE_DSN_03a.pdf.jpg2003Validation of aproximate dependability models of a RAID architecture with orthogonal organizationCarrasco, Juan A.
IEEE_DSN_03b.pdf.jpg2003A combinatorial method for the evaluation of yield of fault-tolerant systems-on-chipSuñé, Víctor; Rodríguez Montañés, Rosa; Carrasco, Juan A.; Munteanu, D-P
COMM_02.pdf.jpg2002Markovian reliability analysis of non-coherent non-repairable fault-tolerant interconnection networksCarrasco, Juan A.; Suñé, Víctor; Rincu, C-I
IEEE_MASCOTS_99.pdf.jpg1999Failure distance based bounds for steady-state availability without the kwnowledge of minimal cutsSuñé, Víctor; Carrasco, Juan A.
LNCS_98.pdf.jpg1998A comparison of numerical splitting-based methods for Markovian dependability and performability modelsSuñé, Víctor; Carrasco, Juan A.
IEEE_IPDS_98.pdf.jpg1998Bounding steady-state availability models with phase type repair distributionsCarrasco, Juan A.
DCIS_97.pdf.jpg1997METFAC-2: A tool for specification and solution of Markov performance, dependability and performability modelsCarrasco, Juan A.; Domingo Fuster, José Luis
IEEE_MASCOTS_97.pdf.jpg1997A method for the computation of reliability bounds for non-repairable fault-tolerant systemsSuñé, Víctor; Carrasco, Juan A.
IEEE_MASCOTS_96.pdf.jpg1996Two new algorithms to compute steady-state bounds for Markov models with slow forward and fast backward transitionsCarrasco, Juan A.; Calderón, A; Escribà, J
IEEE_DAC_95.pdf.jpg1995Synthesis of IDDQ-Testable Circuits: Integrating Built-in Current SensorsWunderlich, H J; Herzog, M; Figueras Pàmies, Joan; Carrasco, Juan A.; Calderón, A
IEEE_IPDS_95.pdf.jpg1995Computation of absorption probability distributions of continuous-time Markov chains using regenerative randomizationCarrasco, Juan A.; Calderón, A
DCCA_95.pdf.jpg1994Improving availability bounds using the failure distance conceptCarrasco, Juan A.
CPE_92.pdf.jpg1992Failure distance-based simulation of repairable fault-tolerant systemsCarrasco, Juan A.
IEEE_AEC_91.pdf.jpg1991Hierarchical object-oriented modeling of fault-tolerant computer systemsCarrasco, Juan A.
IEEE_RDS_91.pdf.jpg1991Efficient transient simulation of failure/repair markovian modelsCarrasco, Juan A.
ESPRIT_89.pdf.jpg31-des-1989Project nº 1609: System measurement and architecture techniques (SMART)Crowe, M K; Carrasco, Juan A.
IEEE_PNPM_89.pdf.jpg1989Automated construction of compound Markov chains from generalized stochastic high-level Petri netsCarrasco, Juan A.
IAESTED_87.pdf.jpg1987Analysis of sparse numerical methods for dependability evaluationCarrasco, Juan A.
ISMM_85.pdf.jpg1985Structural and functional fault-tolerance evaluation of local area networksCarrasco, Juan A.; Figueras Pàmies, Joan

 

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