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QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades >


QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades

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Vista preliminarDataTítolAutor(s)
2013Differential scan-path: A novel solution for secure design-for-testabilityManich Bou, Salvador; S. Wamser, Markus; M. Guillen, Oscar; Sigl, Georg
2013Nondestructive diagnosis of mechanical misalignments in dual axis accelerometersGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2013M-S test based on specification validation using octrees in the measure spaceGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2013BIST Architecture to Detect Defects in TSVs During Pre-Bond TestingArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan
2013Information Leakage Reduction at the Scan-Path OutputManich Bou, Salvador; S. Wamser, Markus; Sigl, Georg
2013Improving the security of scan path test using differential chainsManich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
dcis2012.pdf.jpg2012SRAM stability metric under transient noiseVatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
dcis2012.pdf.jpg2012Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
2011Transient noise failures in SRAM cells: dynamic noise margin metricVatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan
dcis2011.pdf.jpg20118T SRAM Cell with Open Defects under Voltage and Timing VariationsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Castillo Muñoz, Raul
DCIS_2011.pdf.jpg2011Maximum IR-drop in On-Chip Power Distribution Networks of Wire-Bonded Integrated CircuitsRius Vázquez, José; Aguareles Carrero, María
2011CLIL implementation at a Spanish university: A pilot experienceAguilar Pérez, Marta; Rodríguez Montañés, Rosa; Oriol, Carlos
2011Testing IC accelerometers using Lissajous compositionsGómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
2011Identification of component deviations in analog circuits using digital signaturesGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
INSS10_FORMATTED.pdf.jpg15-jun-2010Two-Dimensional Communication of Networked Devices Through a Single Conductive SurfaceRius Vázquez, José
ets10_15_2.pdf.jpg24-mai-2010Diagnosis of full open defects in interconnect lines with fan-outArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, C.; Kruseman, Bram
2010Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVSVatajelu, Elena Ioana; Renovell, Michel; Figueras Pàmies, Joan
2010Statistical analysis of SRAM aarametric failure under supply voltage scalingVatajelu, Elena Ioana; Figueras Pàmies, Joan
2010Parametric Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic AnalysisVatajelu, Elena Ioana; Panagopoulos, Georgios; Roy, Kaushik; Figueras Pàmies, Joan
2010Defective Behaviour of an 8T SRAM Cell with Open DefectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador; Figueras Pàmies, Joan; Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto
IP5_06.pdf.jpg2010Analog circuit test based on a digital signatureGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
2010A Single Conductive Surface as Communication Media for Networked DevicesRius Vázquez, José
digital signature generator.pdf.jpg2009Digital signature generator for mixed-signal testingSanahuja Moliner, Ricard; Gómez Pau, Álvaro; Balado Suárez, Luz María; Figueras Pàmies, Joan
p102.pdf.jpg2009Verifying analog circuits based on a digital signatureGómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suárez, Luz María; Figueras Pàmies, Joan
getPDF.pdf.jpg31-mai-2007Diagnosis of full open defects in interconnecting linesRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram; Lousberg, M.; Majhi, A.K.
IEEE_ASS_06.pdf.jpg2006Adapted importance sampling schemes for the simulation of dependability models of Fault-tolerant systems with deferred repairCarrasco López, Juan Antonio
IEEE_DSN_03a.pdf.jpg2003Validation of aproximate dependability models of a RAID architecture with orthogonal organizationCarrasco López, Juan Antonio
IEEE_DSN_03b.pdf.jpg2003A combinatorial method for the evaluation of yield of fault-tolerant systems-on-chipSuñé Socías, Víctor Manuel; Rodríguez Montañés, Rosa; Carrasco López, Juan Antonio; Munteanu, D-P
IEEE_MASCOTS_99.pdf.jpg1999Failure distance based bounds for steady-state availability without the kwnowledge of minimal cutsSuñé Socías, Víctor Manuel; Carrasco López, Juan Antonio
IEEE_MASCOTS_97.pdf.jpg1997A method for the computation of reliability bounds for non-repairable fault-tolerant systemsSuñé Socías, Víctor Manuel; Carrasco López, Juan Antonio
IEEE_MASCOTS_96.pdf.jpg1996Two new algorithms to compute steady-state bounds for Markov models with slow forward and fast backward transitionsCarrasco López, Juan Antonio; Calderón, A; Escribà, J
IEEE_DAC_95.pdf.jpg1995Synthesis of IDDQ-Testable Circuits: Integrating Built-in Current SensorsWunderlich, H J; Herzog, M; Figueras Pàmies, Joan; Carrasco López, Juan Antonio; Calderón, A
IEEE_IPDS_95.pdf.jpg1995Computation of absorption probability distributions of continuous-time Markov chains using regenerative randomizationCarrasco López, Juan Antonio; Calderón, A
IEEE_AEC_91.pdf.jpg1991Hierarchical object-oriented modeling of fault-tolerant computer systemsCarrasco López, Juan Antonio
IEEE_RDS_91.pdf.jpg1991Efficient transient simulation of failure/repair markovian modelsCarrasco López, Juan Antonio
IEEE_PNPM_89.pdf.jpg1989Automated construction of compound Markov chains from generalized stochastic high-level Petri netsCarrasco López, Juan Antonio

 

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