DSpace DSpace UPC
 Català   Castellano   English  

E-prints UPC >
Enginyeria electrònica i telecomunicacions >
QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades >


QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades

Articles de revista : [43]

Cerca a aquesta col·lecció:


 




Llista per 
Subscriviu-vos per rebre un correu electrònic cada vegada que s'introdueixi un nou ítem en aquesta col·lecció.
Vista preliminarDataTítolAutor(s)
mai-2014FPGA implementation of a PWM for a three-phase DC-AC multilevel active-clamped converterLupón Roses, Emilio; Busquets Monge, Sergio; Nicolás Apruzzese, Joan
JOC_2013.pdf.jpg18-nov-2013A new general-purpose method for the computation of the interval availability distributionCarrasco, Juan A.
447-2620-1-PB.pdf.jpg1-oct-2013Una propuesta de evaluación de competencias genéricas en grados de IngenieríaMartínez Martínez, María del Rosario; Amante García, Beatriz; Cadenato Matia, Ana María; Rodríguez Montañés, Rosa
5-set-2013A Highly time sensitive XOR gate for probe attempt detectorsManich Bou, Salvador; Strasser, Martin
CSSC_14.pdf.jpgago-2013Reliability bounds for fault-tolerant systems with deferred repair using bounding split regenerative randomizationTemsamani, Jamal; Carrasco, Juan A.
20-mar-2012IR-drop in on-chip power distribution networks of ICs with nonuniform power consumptionRius Vázquez, José
1-feb-2012Optimization of oxygen transfer through venturi-based systems applied to the biological sweetening of biogasRodriguez, Ginesta; Dorado Castaño, Antonio David; Bonsfills Pedrós, Anna; Sanahuja Moliner, Ricard; Gabriel, David; Gamisans Noguera, Javier
IEEE_TDSC_11.pdf.jpg12-set-2011A Numerical method for the evaluation of the distribution of cumulative reward till exit of a Subset of transient states of a Markov reward modelCarrasco, Juan A.; Suñé, Víctor
05638632.pdf.jpgjun-2011Gate leakage impact on full open defects in interconnect linesArumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram
2011Lecturer and student perceptions on CLIL at a spanish universityAguilar Pérez, Marta; Rodríguez Montañés, Rosa
JOC_2011.pdf.jpg2011An efficient and numerically stable method for computing bounds for the interval availability distributionCarrasco, Juan A.
getPDF.pdf.jpgfeb-2010Localization and Electrical Characterization of Interconnect Open DefectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Beverloo, Willem; Vries, Dirk K. de; Eichenberger, Stefan; Volf, Paul A. J.
getPDF.pdf.jpgfeb-2010Built-In Sensor for Signal Integrity Faults in Digital Interconnect SignalsChampac Vilela, Víctor Hugo; Avendaño, Victor; Figueras Pàmies, Joan
IEEE_TC_10.pdf.jpggen-2010Comment on "Performability analysis: a new algorithm"Suñé, Víctor; Carrasco, Juan A.; Nabli, H; Sericola, B
IEEE_TVLSI_09.pdf.jpgfeb-2009An ROBDD-based combinatorial method for the evaluation of yield of defect-tolerant systems-on-chipCarrasco, Juan A.; Suñé, Víctor
OR_2008.pdf.jpgset-2008Cumulative dominance and heuristic performance in binary multiattribute choiceCarrasco, Juan A.; Baucells, M; Hogarth, R M
CJ_08.pdf.jpg1-jun-2008Corrigendum: "Transient Analysis of Rewarded Continuous Time Markov Models by Regenerative Randomization with Laplace Transform Inversion"Carrasco, Juan A.
MSS_08.pdf.jpgmar-2008Tight upper bounds for the expected loss of lexicographic heuristics in binary multiattribute choiceCarrasco, Juan A.; Baucells, M
04349252.pdf.jpgoct-2007Impact of gate tunnelling leakage on CMOS circuits with full open defectsRodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Eichenberger, S.; Hora, Camelia; Kruseman, B.
IEEE_TR_07b.pdf.jpg1-jun-2007Corrections on “Failure Transition Distance-Based Importance Sampling Schemes for the Simulation of Repairable Fault-Tolerant Computer Systems"Carrasco, Juan A.
PEVA_06.pdf.jpgdes-2006Two methods for computing bounds for the distribution of cumulative reward for large Markov modelsCarrasco, Juan A.
IEEE_TR_07a.pdf.jpgjun-2006Failure transition distance-based importance sampling schemes for the simulation of repairable fault-tolerant computer systemsCarrasco, Juan A.
NRL_06.pdf.jpgjun-2006Transient analysis of Markov models of fault-tolerant systems with deferred repair using split regenerative randomizationCarrasco, Juan A.; Temsamani, Jamal
CSSC_05b.pdf.jpgoct-2005Transient analysis of large Markov models with absorbing states using regenerative randomizationCarrasco, Juan A.
CSSC_05a.pdf.jpgjul-2005A generalized method for the transient analysis of Markov models of fault-tolerant systems with deferred repairTemsamani, J; Carrasco, Juan A.
COR_05.pdf.jpgmai-2005Efficient implementations of the randomization method with control of the relative errorSuñé, Víctor; Carrasco, Juan A.
IEEE_TC_04.pdf.jpgset-2004Transient analysis of some rewarded Markov models using randomization with quasistationarity detectionCarrasco, Juan A.
COR_04.pdf.jpgmai-2004Solving large interval availability models using a model transformation approachCarrasco, Juan A.
MR_04.pdf.jpgfeb-2004Combinatorial methods for the evaluation of yield and operational reliability of fault-tolerant systems-on-chipCarrasco, Juan A.; Suñé, Víctor
IEEE_TR_03.pdf.jpgset-2003Solving dependability/performability irreducible Markov models using regenerative randomizationCarrasco, Juan A.
COR_03.pdf.jpgjun-2003Computation of Bounds for Transient Measures of Large Rewarded Markov Models using Regenerative RandomizationCarrasco, Juan A.
IEEE_TC_02.pdf.jpgmar-2002Computationally efficient and numerically stable reliability bounds for repairable fault-tolerant systemsCarrasco, Juan A.
00935791.pdf.jpgjun-2001Model of the leaky bucket ATM generic flow control mechanism: a case study on solving large cyclic modelsCarrasco, Juan A.; Suñé, Víctor; Mahévas, S; Rubino, G
IEEE_TR_01.pdf.jpgmar-2001A failure-distance dased method to bound the reliability of non-repairable fault-tolerant systems without the knowledge of minimal cutsSuñé, Víctor; Carrasco, Juan A.
PEVA_00.pdf.jpgfeb-2000Numerical iterative methods for Markovian dependability and performability models: new results and a comparisonSuñé, Víctor; Domingo Fuster, José Luis; Carrasco, Juan A.
10.1007_3-540-45591-4_169.pdf.jpg2000Transient analysis of dependability/performability models by regenerative randomization with Laplace transform in versionCarrasco, Juan A.
IEEE_IPDS_98.pdf.jpgmai-1999Bounding steady-state availability models with group repair and phase type repair distributionsCarrasco, Juan A.
IEEE_TR_99.pdf.jpgmar-1999An algorithm to find minimal cuts of coherent fault-trees with event-classes using a decision treeCarrasco, Juan A.; Suñé, Víctor
PEVA_98.pdf.jpgset-1998Tight steady-state availability bounds using the failure distance conceptCarrasco, Juan A.
PER_96.pdf.jpgmai-1996Efficient exploration of availability models guided by failure distancesCarrasco, Juan A.; Calderón, A; Escribá, J
EL_96.pdf.jpgabr-1996Self-timed Manchester chain carry propagate adderEscribà, J; Carrasco, Juan A.
SIGMETRICS_95.pdf.jpgmai-1995Regenerative randomization: theory and application examplesCarrasco, Juan A.; Calderón Alvarez, Angel
JSS_91.pdf.jpgmar-1991Evaluation of safety-oriented two-version architecturesCarrasco, Juan A.; Figueras Pàmies, Joan; Kuntzman, A

 

Valid XHTML 1.0! Programari DSpace Copyright © 2002-2004 MIT and Hewlett-Packard Comentaris
Universitat Politècnica de Catalunya. Servei de Biblioteques, Publicacions i Arxius