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E-prints UPC >
Enginyeria electrònica i telecomunicacions >
QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades >
| Vista preliminar | Data | Títol | Autor(s) |  | - | Gate leakage impact on full open defects in interconnect lines | Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pàmies, Joan; Eichenberger, Stefan; Hora, Camelia; Kruseman, Bram |
| 20-mar-2012 | IR-drop in on-chip power distribution networks of ICs with nonuniform power consumption | Rius Vázquez, José |
| 1-feb-2012 | Optimization of oxygen transfer through venturi-based systems applied to the biological sweetening of biogas | Rodriguez, Ginesta; Dorado Castaño, Antonio David; Bonsfills Pedrós, Anna; Sanahuja Moliner, Ricard; Gabriel, David; Gamisans Noguera, Javier |
| 2011 | Lecturer and student perceptions on CLIL at a spanish university | Aguilar Pérez, Marta; Rodríguez Montañés, Rosa |
 | feb-2010 | Localization and Electrical Characterization of Interconnect Open Defects | Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Figueras Pàmies, Joan; Beverloo, Willem; Vries, Dirk K. de; Eichenberger, Stefan; Volf, Paul A. J. |
 | feb-2010 | Built-In Sensor for Signal Integrity Faults in Digital Interconnect Signals | Champac Vilela, Víctor Hugo; Avendaño, Victor; Figueras Pàmies, Joan |
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