InN thin film lattice dynamics by grazing incidence inelastic x-ray scattering
Tipus de documentArticle
Data publicació2011-05-19
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Abstract
Achieving comprehensive information on thin film lattice dynamics so far has eluded well established
spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray
scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the
acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium
nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell
applications in combination with other group III nitrides
CitacióSerrano, J. [et al.]. InN thin film lattice dynamics by grazing incidence inelastic x-ray scattering. "Physical review letters", 19 Maig 2011, vol. 106, núm. 20, p. 1-4.
ISSN0031-9007
Versió de l'editorhttp://prl.aps.org/abstract/PRL/v106/i20/e205501
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