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    <title>DSpace Collection:</title>
    <link>http://hdl.handle.net/2117/601</link>
    <description />
    <items>
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        <rdf:li rdf:resource="http://hdl.handle.net/2117/15667" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/15019" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/15007" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/13911" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/13385" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/13055" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/13054" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/13053" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/12139" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/11978" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/11976" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/8112" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/2347" />
        <rdf:li rdf:resource="http://hdl.handle.net/2117/1232" />
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    </items>
    <dc:date>2013-05-21T10:41:17Z</dc:date>
  </channel>
  <item rdf:about="http://hdl.handle.net/2117/15667">
    <title>Process variability in sub-16nm bulk CMOS technology</title>
    <link>http://hdl.handle.net/2117/15667</link>
    <description>Title: Process variability in sub-16nm bulk CMOS technology
Authors: Rubio Sola, Jose Antonio; Figueras Pàmies, Joan; Vatajelu, Elena Ioana; Canal Corretger, Ramon
Abstract: The document is part of deliverable D3.6 of the TRAMS Project (EU FP7 248789), of public nature, and shows and justifies the levels of variability used in the research project for sub-18nm bulk CMOS technologies.</description>
    <dc:date>2012-03-26T18:45:53Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/15019">
    <title>Dynamic fine-grain body biasing of caches with latency and leakage 3T1D-based monitors</title>
    <link>http://hdl.handle.net/2117/15019</link>
    <description>Title: Dynamic fine-grain body biasing of caches with latency and leakage 3T1D-based monitors
Authors: Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio
Abstract: In this paper, we propose a dynamically tunable fine-grain body biasing mechanism to reduce active &amp; standby leakage power in caches under process variations.</description>
    <dc:date>2012-02-08T12:50:44Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/15007">
    <title>On the effectiveness of hybrid mechanisms on reduction of parametric failures in caches</title>
    <link>http://hdl.handle.net/2117/15007</link>
    <description>Title: On the effectiveness of hybrid mechanisms on reduction of parametric failures in caches
Authors: Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio
Abstract: In this paper, we provide an insight on the different proactive read/write assist methods (wordline boosting &amp; adaptive body biasing) that help in preventing (and reducing) parametric failures when coupled with reactive techniques like ECC and redundancy which cope with already existent failures. While proactive and reactive have been previously viewed as complementary techniques, we show that it is not necessarily the case when considering the benefits of such hybrid schemes.</description>
    <dc:date>2012-02-08T11:07:29Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/13911">
    <title>vPROBE: Variation aware post-silicon power/performance binning using embedded 3T1D cells</title>
    <link>http://hdl.handle.net/2117/13911</link>
    <description>Title: vPROBE: Variation aware post-silicon power/performance binning using embedded 3T1D cells
Authors: Ganapathy, Shrikanth; Canal Corretger, Ramon; González Colás, Antonio María; Rubio Sola, Jose Antonio
Abstract: In this paper, we present an on-die post-silicon binning methodology that takes into account the effect of static and dynamic variations and categorizes every processor based on power/performance.The proposed scheme is composed of a discretization hardware that exploits the delay/leakage dependence on variability sources characteristic for categorization</description>
    <dc:date>2011-11-15T14:28:57Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/13385">
    <title>FOCSI: A new layout regularity metric</title>
    <link>http://hdl.handle.net/2117/13385</link>
    <description>Title: FOCSI: A new layout regularity metric
Authors: Pons Solé, Marc; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; González Colás, Antonio María
Abstract: Digital CMOS Integrated Circuits (ICs) suffer from serious layout features printability issues associated to the lithography manufacturing process. Regular layout designs are emerging as alternative solutions to reduce these ICs systematic subwavelength lithography failures. However, there is no metric to evaluate and compare the layout regularity of those regular designs.&#xD;
In this paper we propose a new layout regularity metric&#xD;
called Fixed Origin Corner Square Inspection (FOCSI).&#xD;
FOCSI allows the comparison and quantification of designs&#xD;
in terms of regularity and for any given degree of&#xD;
granularity. When FOCSI is oriented to the evaluation&#xD;
of regularity while applying Lithography Enhancement&#xD;
Techniques, it comprehends layout layers measurements&#xD;
considering the optical interaction length&#xD;
and combines them to obtain the complete layout regularity&#xD;
measure. Examples are provided for 32-bit adders&#xD;
in the 90 nm technology node for the Standard Cell approach&#xD;
and for Via-Configurable Transistor Array regular&#xD;
designs. We show how layouts can be sorted accurately&#xD;
even if their degree of regularity is similar.
Description: Technical Report</description>
    <dc:date>2011-09-29T08:11:25Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/13055">
    <title>THERMAL OBSERVATION OF A MODULATED INPUT FOR A 2.5GHZ CMOS POWER AMPLIFIER Part 3: PA+Sensor layout integration and PVT analysis</title>
    <link>http://hdl.handle.net/2117/13055</link>
    <description>Title: THERMAL OBSERVATION OF A MODULATED INPUT FOR A 2.5GHZ CMOS POWER AMPLIFIER Part 3: PA+Sensor layout integration and PVT analysis
Authors: Martín, Mikel; González Jiménez, José Luis
Abstract: The objective is to detect the impact of PVT variations (Process, Voltage and Temperature variations) on the figures of merit of a device.</description>
    <dc:date>2011-07-26T17:38:37Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/13054">
    <title>THERMAL OBSERVATION OF A MODULATED INPUT FOR A 2.5GHZ CMOS POWER AMPLIFIER Part 2: Temperature Sensor</title>
    <link>http://hdl.handle.net/2117/13054</link>
    <description>Title: THERMAL OBSERVATION OF A MODULATED INPUT FOR A 2.5GHZ CMOS POWER AMPLIFIER Part 2: Temperature Sensor
Authors: Martín, Mikel; González Jiménez, José Luis
Abstract: The temperature sensor used is based on the usual two bipolar transistors temperature sensor with some modifications to allow for external calibration (or “re-centering”).</description>
    <dc:date>2011-07-26T17:36:51Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/13053">
    <title>THERMAL OBSERVATION OF A MODULATED INPUT FOR A 2.5GHZ CMOS POWER AMPLIFIER Part 1: Feasibility study</title>
    <link>http://hdl.handle.net/2117/13053</link>
    <description>Title: THERMAL OBSERVATION OF A MODULATED INPUT FOR A 2.5GHZ CMOS POWER AMPLIFIER Part 1: Feasibility study
Authors: Martin, Mikel; González Jiménez, José Luis
Abstract: In this Project, the verification of the possibility of extraction of information of a modulated signal through no-invasive thermal measurements is done. The main objective is that using a non-invasive thermal technique, information about the PA can be extracted so that the PA’s efficiency can be improved.</description>
    <dc:date>2011-07-26T17:33:53Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/12139">
    <title>CATRENE-PANAMA project review November 2010</title>
    <link>http://hdl.handle.net/2117/12139</link>
    <description>Title: CATRENE-PANAMA project review November 2010
Authors: González Jiménez, José Luis; Dufis, Cédric Yvan
Abstract: Informe de progrés del projecte Europeu CATRENE-PANAMA sobre les tasques desenvolupades per el grup de recerca HiPICS de la UPC</description>
    <dc:date>2011-03-29T12:50:52Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/11978">
    <title>Inforrme de la segona anualitat del projecte CATRENE-PANAMA per al programa AVANZA I+D</title>
    <link>http://hdl.handle.net/2117/11978</link>
    <description>Title: Inforrme de la segona anualitat del projecte CATRENE-PANAMA per al programa AVANZA I+D
Authors: González Jiménez, José Luis; Dufis, Cédric Yvan
Abstract: Informe de les tasques i activitats desenvolupades al projecte europeu CATRENE-PANAMA durant l'any 2010 per el grup de recerca de la UPC HiPICS</description>
    <dc:date>2011-03-21T09:20:31Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/11976">
    <title>CATRENE-PANAMA project review June 2010</title>
    <link>http://hdl.handle.net/2117/11976</link>
    <description>Title: CATRENE-PANAMA project review June 2010
Authors: González Jiménez, José Luis; Dufis, Cédric Yvan
Abstract: Informe de progrés del projecte Europeu CATRENE-PANAMA sobre les tasques desenvolupades per el grup de recerca HiPICS de la UPC</description>
    <dc:date>2011-03-21T09:13:03Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/8112">
    <title>CATRENE-PANAMA WP1: integrated PA Milestone M1.3 technology, approach &amp; system choice for home networking</title>
    <link>http://hdl.handle.net/2117/8112</link>
    <description>Title: CATRENE-PANAMA WP1: integrated PA Milestone M1.3 technology, approach &amp; system choice for home networking
Authors: Dufis, Cédric Yvan; Mateo Peña, Diego; Bofill, Adrià; González Jiménez, José Luis</description>
    <dc:date>2010-07-09T12:01:48Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/2347">
    <title>Set-up of Assura RCX-HF tools for the AMS S35 process. Configuration files and usage guide.</title>
    <link>http://hdl.handle.net/2117/2347</link>
    <description>Title: Set-up of Assura RCX-HF tools for the AMS S35 process. Configuration files and usage guide.
Authors: Aragonès Cervera, Xavier</description>
    <dc:date>2008-11-07T08:27:20Z</dc:date>
  </item>
  <item rdf:about="http://hdl.handle.net/2117/1232">
    <title>Energy macro-model for on chip interconnection buses</title>
    <link>http://hdl.handle.net/2117/1232</link>
    <description>Title: Energy macro-model for on chip interconnection buses
Authors: Mendoza Vázquez, Raymundo; Pons Solé, Marc; Moll Echeto, Francisco de Borja; Figueras, Joan
Abstract: This report presents a fast method of evaluating the power consumption of a bus. Given an on-chip bus driver-interconnection-receiver design of N parallel lines,the objective is to develop its energy consumption macro-model. With this model we are be able to evaluate the energy metrics for the bus under a certain traffic and information coding.</description>
    <dc:date>2007-10-05T08:09:54Z</dc:date>
  </item>
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