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Extraction of an avalanche diode noise model for its application as on-wafer noise source
(JOHN WILEY & SONS INC, 2003-07-31)
Article
Accés obertThis paper presents a method to characterize the excess noise ratio (ENR) of an unmatched avalanche noise diode for application as an on-wafer noise source. It is based on the determination of a broadband device noise ...