Exploració per tema "noise-parameter measurements"
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Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model
(JOHN WILEY & SONS INC, 2003-11-30)
Article
Accés obertThe bias-dependence of microwave-FET intrinsic noise sources in their hybrid configuration is theoretically determined, using a new quasi-2D (Q-2D) physical model based on Thornber's current equation [8]. It is shown that ...