Exploració per tema "microwave-FET intrinsic noise sources"

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    • Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model 

      Lázaro Guillén, Antoni; Maya Sánchez, Mª del Carmen; Pradell i Cara, Lluís (JOHN WILEY & SONS INC, 2003-11-30)
      Article
      Accés obert
      The bias-dependence of microwave-FET intrinsic noise sources in their hybrid configuration is theoretically determined, using a new quasi-2D (Q-2D) physical model based on Thornber's current equation [8]. It is shown that ...