Exploració per tema "microwave reflectometry"
Ara es mostren els items 1-1 de 1
-
New Theoretical Analysis of the LRRM Calibration Technique for Vector Network Analyzers
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2001-10-31)
Article
Accés obertIn this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) vector network-analyzer (VNA) calibration technique is presented. As a result, it is shown that the reference-impedance (to ...