Exploració per tema "local parameters"
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Comparison between nonlinear measurements in patterned and unpatterned thin films
(IOP PUBLISHING LTD, 2004-07-31)
Article
Accés obertThis work compares two alternative methods of characterizing the nonlinearities in a 10 × 10 mm2 superconducting thin film. Both methods are based on measuring the intermodulation distortion in high temperature superconducting ...