Exploració per tema "high electron mobility transistors"
Ara es mostren els items 1-5 de 5
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Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model
(JOHN WILEY & SONS INC, 2003-11-30)
Article
Accés obertThe bias-dependence of microwave-FET intrinsic noise sources in their hybrid configuration is theoretically determined, using a new quasi-2D (Q-2D) physical model based on Thornber's current equation [8]. It is shown that ... -
Direct extraction of all four transistor noise parameters from 50 noise figure measurements
(IEE, 1998-02-05)
Article
Accés obertA new method for measuring the four noise parameters (NPs) of a transistor is presented. It is based on the determination of its intrinsic noise matrix elements (C11INT, C22INT, Re(C12INT), Im(C12INT)) by fitting the ... -
Method for measuring noise parameters of microwave two-port
(IEE, 1998-06-30)
Article
Accés obertA new tuner-based method for measuring the four noise-parameters of a two-port is proposed. It makes use of a novel measurement ratio that includes noise powers and mismatch factors simultaneously. In contrast to previous ... -
Model predicts large-signal modfet performance
(PENTON MEDIA, INC, 1989-11-30)
Article
Accés obertModulation doped FETs (MODFETs) provide low-noise performance in many medium- and high-power microwave applications. Unfortunately, there are few large-signal models available for MODFETs, and determining the parameters ... -
Planck-LFI 44-GHz back end module
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2005-10-31)
Article
Accés obertThis work describes the principle of operation, assembly and performance of one branch of the 44 GHz back end module (BEM) for the Planck low frequency instrument (LFI). This subsystem constitutes a fully representative ...