• Efficient parametric characterization of the dynamic performance of an RFID IC 

      Capdevila Cascante, Santiago; Jofre Roca, Lluís; Romeu Robert, Jordi; Bolomey, J.Ch (2012)
      Article
      Accés restringit per política de l'editorial
      In this letter, a measurement technique for a complete parametric characterization of the input impedance of an RFID IC is presented. The use of an SPDT switch to modulate the signal from the network analyzer provides ...
    • UWB MST MEMS-based near-field imaging system 

      Capdevila Cascante, Santiago; Jofre Cruanyes, Marc; Rodríguez, J.; Guardiola Garcia, Marta; Papió, Anna; de Flaviis, Franco; Jofre Roca, Lluís (2008)
      Text en actes de congrés
      Accés obert
      In this paper a new family of illuminators and MST measurement architectures is presented and the di erent aspects are studied.