Exploració per tema "Microscopy."
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Depth aberrations characterization in linear and nonlinear microscopy schemes using a Shack-Hartmann wavefront sensor
(2012)
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Accés restringit per política de l'editorialThe performance of imaging devices such as linear and nonlinear microscopes (NLM) can be limited by the optical properties of the imaged sample. Such an important aspect has already been described using theoretical models ...