Exploració per tema "Mesurament de microones"

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    • A vector approach for noise parameter fitting and selection of source admittances 

      O'Callaghan Castellà, Juan Manuel; Mondal, J. P. (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 1991-08-31)
      Article
      Accés obert
      Simple vector concepts can be used in the determination of noise parameters from measured data. The use of such concepts leads to a simplification in the least-square fitting algorithm, complete determination of the ...