• Design and implementation of automatic test equipment IP module 

      Fransi Palos, Sergi; Farre Lozano, Goretti; Garcia Deiros, Lucas; Manich Bou, Salvador (Institute of Electrical and Electronics Engineers (IEEE), 2010-05-24)
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      This paper presents an Intellectual Property (IP) module that includes fully functional autonomous Automatic Test Equipment (ATE). The module analyses responses from the Device Under Test (DUT) after sending test vectors ...