Exploració per tema "Integrated circuits -- Verification"

Ara es mostren els items 1-2 de 2

    • Defect-oriented non-intrusive RF test using on-chip temperature sensors 

      Abdallah, L.; Stratigopoulos, H. G.; Mir, S.; Altet Sanahujes, Josep (Institute of Electrical and Electronics Engineers (IEEE), 2013)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      We present a built-in, defect-oriented test approach for RF circuits that is based on thermal monitoring. A defect will change the power dissipation of the circuit under test from its expected range of values which, in ...

    • Verification of timed circuits with symbolic delays 

      Clarisó Viladrosa, Robert; Cortadella, Jordi (Institute of Electrical and Electronics Engineers (IEEE), 2004)
      Text en actes de congrés
      Accés obert
      Verifying timed circuits is a complex problem even when the delays of the system are fixed. This paper deals with a more challenging problem, the formal verification of timed circuits with unspecified delays represented ...