Exploració per tema "Integrated circuit yield"

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    • SSFB: a highly-efficient and scalable simulation reduction technique for SRAM yield analysis 

      Rana, Manish; Canal Corretger, Ramon (European Interactive Digital Advertising Alliance (EDAA), 2014)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Estimating extremely low SRAM failure-probabilities by conventional Monte Carlo (MC) approach requires hundreds-of-thousands simulations making it an impractical approach. To alleviate this problem, failure-probability ...