Exploració per tema "Integrated circuit testing"

Ara es mostren els items 1-3 de 3

    • Defect-oriented non-intrusive RF test using on-chip temperature sensors 

      Abdallah, L.; Stratigopoulos, H. G.; Mir, S.; Altet Sanahujes, Josep (Institute of Electrical and Electronics Engineers (IEEE), 2013)
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      We present a built-in, defect-oriented test approach for RF circuits that is based on thermal monitoring. A defect will change the power dissipation of the circuit under test from its expected range of values which, in ...

    • Design of a broadband CMOS RF power amplifier to establish device-circuit aging correlations 

      Barajas Ojeda, Enrique; Mateo Peña, Diego; Aragonès Cervera, Xavier; Crespo Yepes, Albert; Rodríguez Martínez, Rosana; Martin Martínez, Javier; Nafría Maqueda, Montserrat (Institute of Electrical and Electronics Engineers (IEEE), 2017)
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      This paper presents the design of a Broadband CMOS RF Power Amplifier, suitable to be stressed at circuit level but with the possibility to be measured both at circuit and at device level. It allows establishing a relation ...

    • Temperature sensors and measurements to test analogue circuits: questions and answers 

      Altet Sanahujes, Josep; Rubio Sola, Jose Antonio; Reverter Cubarsí, Ferran; Perpiñà Gilabet, Xavier; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Mateo Peña, Diego (Institute of Electrical and Electronics Engineers (IEEE), 2016)
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      We have been working in the field of temperature sensors and temperature measurements to test analogue circuits during the past 10 years. As we have presented different works in many conferences, we have collected many ...