Exploració per tema "Design for manufacturability"

Ara es mostren els items 1-5 de 5

    • A boolean rule-based approach for manufacturability-aware cell routing 

      Cortadella, Jordi; Petit Silvestre, Jordi; Gómez Fernández, Sergio; Moll Echeto, Francisco de Borja (2014-03-01)
      Article
      Accés obert
      An approach for cell routing using gridded design rules is proposed. It is technology-independent and parameterizable for different fabrics and design rules, including support for multiple-patterning lithography. The core ...

    • Area-optimal transistor folding for 1-D gridded cell design 

      Cortadella, Jordi (2013-11)
      Article
      Accés obert
      The 1-D design style with gridded design rules is gaining ground for addressing the printability issues in subwavelength photolithography. One of the synthesis problems in cell generation is transistor folding, which ...

    • FOCSI: A new layout regularity metric 

      Pons Solé, Marc; Moll Echeto, Francisco de Borja; Rubio Sola, Jose Antonio; Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; González Colás, Antonio María (2009-06-09)
      Report de recerca
      Accés obert
      Digital CMOS Integrated Circuits (ICs) suffer from serious layout features printability issues associated to the lithography manufacturing process. Regular layout designs are emerging as alternative solutions to reduce ...

    • Lithography parametric yield estimation model to predict layout pattern distortions with a reduced set of lithography simulations 

      Gómez Fernández, Sergio; Moll Echeto, Francisco de Borja; Mauricio Ferré, Juan (2014-07-01)
      Article
      Accés obert
      A lithography parametric yield estimation model is presented to evaluate the lithography distortion in a printed layout due to lithography hotspots. The aim of the proposed yield model is to provide a new metric that enables ...

    • On the use of static temperature measurements as process variation observable 

      Gómez, Didac; Altet Sanahujes, Josep; Mateo Peña, Diego (2012-10)
      Article
      Accés restringit per política de l'editorial
      In this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, ...