Exploració per tema "CMOS process variation"
Ara es mostren els items 1-2 de 2
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On the use of static temperature measurements as process variation observable
(2012-10)
Article
Accés restringit per política de l'editorialIn this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, ... -
Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations
(2011-06)
Article
Accés restringit per política de l'editorialBuilt-in test and on-chip calibration features are becoming essential for reliable wireless connectivity of next generation devices suffering from increasing process variations in CMOS technologies. This paper contains ...