• A new approach to modelling the impact of EMI on MOSFET DC behavior 

      Fernández García, Raúl; Gil Galí, Ignacio; Boyer, A.; BenDhia, S.; Vrignon, Bertrand (2011-12-12)
      Article
      Accés obert
      A simple analytical model to predict the DC MOSFET behavior under electromagnetic interference (EMI) is presented. The model is able to describe the MOSFET performance in the linear and saturation regions under EMI disturbance ...