Exploració per autor "Stefancich, M."

Ara es mostren els items 1-3 de 3

    • Energy dissipation in the presence of sub-harmonic excitation in dynamic atomic force microscopy 

      Chiesa, Matteo; Gadelrab, Karim Raafat; Verdaguer, Albert; Segura, Juan José; Barcons Xixons, Víctor; Thomson, Neil H.; Phillips, M.A.; Stefancich, M.; Santos Hernández, Sergio (2012-09)
      Article
      Accés obert
      Amplitude modulation atomic force microscopy allows quantifying energy dissipation in the nanoscale with great accuracy with the use of analytical expressions that account for the fundamental frequency and higher harmonics. ...

    • Investigation of nanoscale interactions by means of subharmonic excitation 

      Santos Hernández, Sergio; Phillips, M.A.; Verdaguer, Albert; Font Teixidó, Josep; Chiesa, Matteo; Gadelrab,, K.; Stefancich, M.; Armstrong, P.; Li, G.; Souier, T.; Thomson, Neil H.; Barcons Xixons, Víctor (2012-08-16)
      Article
      Accés restringit per política de l'editorial
      Multifrequency atomic force microscopy holds promise as a method to provide qualitative and quantitative information about samples with high spatial resolution. Here, we provide experimental evidence of the excitation of ...

    • Quantification of dissipation and deformation in ambient atomic force microscopy 

      Santos Hernández, Sergio; Gadelrab,, K.; Barcons Xixons, Víctor; Stefancich, M.; Chiesa, Matteo (2012-07-20)
      Article
      Accés restringit per política de l'editorial
      A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the ...