Exploració per autor "Grauby, S."
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Four different approaches for the measurement of IC surface temperature: Application to thermal testing
Saulnier, J.B; Altet Sanahujes, Josep; Dilhaire, Stefan; Volz, S.; Rampnoux, J.M.; Rubio Sola, Jose Antonio; Grauby, S.; Patino, L.; Claeys, W. (2002-09)
Article
Accés restringit per política de l'editorialSilicon die surface temperature can be used to monitor the health state of digital and analogue integrated circuits (IC). In the present paper, four different sensing techniques: scanning thermal microscope, laser ...