• TRAMS Project: variability and reliability of SRAM memories in sub-22nm bulk-CMOS technologies 

      Canal Corretger, Ramon; Rubio Sola, Jose Antonio; ASenov, Asen; Brown, Andrew; Miranda, Miguel; Zuber, Paul; González Colás, Antonio María; Vera Rivera, Francisco Javier (Elsevier, 2011-12-22)
      Article
      Accés restringit per política de l'editorial
      The TRAMS (Terascale Reliable Adaptive MEMORY Systems) project addresses in an evolutionary way the ultimate CMOS scaling technologies and paves the way for revolutionary, most promising beyond-CMOS technologies. In this ...