Exploració per autor "Thomson, Neil H."
Ara es mostren els items 4-8 de 8
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Investigation of nanoscale interactions by means of subharmonic excitation
Santos Hernández, Sergio; Phillips, M.A.; Verdaguer, Albert; Font Teixidó, Josep; Chiesa, Matteo; Gadelrab,, K.; Stefancich, M.; Armstrong, P.; Li, G.; Souier, T.; Thomson, Neil H.; Barcons Xixons, Víctor (2012-08-16)
Article
Accés restringit per política de l'editorialMultifrequency atomic force microscopy holds promise as a method to provide qualitative and quantitative information about samples with high spatial resolution. Here, we provide experimental evidence of the excitation of ... -
Spatial horizons in amplitude and frequency modulation atomic force microscopy
Font Teixidó, Josep; Santos Hernández, Sergio; Barcons Xixons, Víctor; Thomson, Neil H.; Verdaguer, Albert; Chiesa, Matteo (2012-01-26)
Article
Accés obertIn dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation (AM and FM) atomic force ... -
Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging
Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Billingsley, Daniel J.; Bonass, William A.; Font Teixidó, Josep; Thomson, Neil H. (2013)
Article
Accés obertA way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 ... -
The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features
Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Font Teixidó, Josep; Thomson, Neil H. (2011)
Article
Accés obert -
Wearing a single DNA molecule with an AFM tip
Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2015-06)
Report de recerca
Accés obertWhile the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is ...