• Investigation of nanoscale interactions by means of subharmonic excitation 

      Santos Hernández, Sergio; Phillips, M.A.; Verdaguer, Albert; Font Teixidó, Josep; Chiesa, Matteo; Gadelrab,, K.; Stefancich, M.; Armstrong, P.; Li, G.; Souier, T.; Thomson, Neil H.; Barcons Xixons, Víctor (2012-08-16)
      Article
      Accés restringit per política de l'editorial
      Multifrequency atomic force microscopy holds promise as a method to provide qualitative and quantitative information about samples with high spatial resolution. Here, we provide experimental evidence of the excitation of ...
    • Spatial horizons in amplitude and frequency modulation atomic force microscopy 

      Font Teixidó, Josep; Santos Hernández, Sergio; Barcons Xixons, Víctor; Thomson, Neil H.; Verdaguer, Albert; Chiesa, Matteo (2012-01-26)
      Article
      Accés obert
      In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation (AM and FM) atomic force ...
    • Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Billingsley, Daniel J.; Bonass, William A.; Font Teixidó, Josep; Thomson, Neil H. (2013)
      Article
      Accés obert
      A way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 ...
    • The intrinsic resolution limit in the atomic force microscope: implications for heights of nano-scale features 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Font Teixidó, Josep; Thomson, Neil H. (2011)
      Article
      Accés obert
    • Wearing a single DNA molecule with an AFM tip 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Font Teixidó, Josep; Thomson, Neil H. (2015-06)
      Report de recerca
      Accés obert
      While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is ...