Exploració per autor "Ruiz, José María"

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    • Ring oscillator switching noise under NBTI wearout 

      Fernández García, Raúl; Gil Galí, Ignacio; Ruiz, José María; Morata Cariñena, Marta (2011)
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      In this paper the switching noise of a CMOS ring oscillator has been analysed when their pFETs are subjected to negative bias temperature instability (NBTI). The impact of pFET under NBTI has been experimentally quantified ...