• Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell 

      Vatajelu, Elena Ioana; Rodríguez Montañés, Rosa; Indaco, Marco; Renovell, Michel; Prinetto, Paolo; Figueras Pàmies, Joan (Institute of Electrical and Electronics Engineers (IEEE), 2015)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      The rapid development of low power, high density, high performance SoCs has pushed the embedded memories to their limits and opened the field to the development of emerging memory technologies. The Spin- Transfer-Torque ...
    • Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS 

      Vatajelu, Elena Ioana; Renovell, Michel; Figueras Pàmies, Joan (IEEE Press. Institute of Electrical and Electronics Engineers, 2010)
      Text en actes de congrés
      Accés restringit per política de l'editorial
    • SRAM cell stability metric under transient voltage noise 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2013-12-20)
      Article
      Accés restringit per política de l'editorial
    • SRAM stability metric under transient noise 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (2012)
      Text en actes de congrés
      Accés obert
      ventional way to analyze the robustness of an SRAM bit cell is to quantify its immunity to static noise. The static immunity to disturbances like process and mi smatch variations, bulk noises, supply rings variations, ...
    • Transient noise failures in SRAM cells: dynamic noise margin metric 

      Vatajelu, Elena Ioana; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pàmies, Joan (IEEE Computer Society Publications, 2011)
      Text en actes de congrés
      Accés restringit per política de l'editorial
      Current nanometric IC processes need to assess the robustness of memories under any possible source of disturbance: process and mismatch variations, bulk noises, supply rings variations, temperature changes, aging and ...