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E-prints UPC >
Llistant per Autor Perpiñà, Xavier
Mostrant resultats 3 a 7 de 7
| Vista preliminar | Data | Títol | Autor(s) |  | 2010 | High-power test device for package thermal assessment and validation of thermal measuremetn tecniques | Jordà, Xavier; Perpiñà, Xavier; Vellvehi, Miquel; Madrid, Francesc; Altet Sanahujes, Josep |
 | 2010 | Hot spot detection in integrated circuits laterally accessing to their substrate using a laser beam | Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel |
 | 2010 | Hot spot detection in integrated circuits laterally accessing to the substrate | Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel |
 | 2010 | Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect | Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel; Mestres, Narcís |
| 5-feb-2013 | Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography | León, J.; Perpiñà, Xavier; Altet Sanahujes, Josep; Vallvehi, Miquel; Jordà, Xavier |
Mostrant resultats 3 a 7 de 7
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