Exploració per autor "Perpiñà, Xavier"
Ara es mostren els items 3-7 de 7
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High-power test device for package thermal assessment and validation of thermal measuremetn tecniques
Jordà, Xavier; Perpiñà, Xavier; Vellvehi, Miquel; Madrid, Francesc; Altet Sanahujes, Josep (IEEE Computer Society Publications, 2010)
Text en actes de congrés
Accés obertThis paper describes the structure and thermal behavior of a high-power thermal test chip (up to 200 W/cm2) designed for power electronics package assessment, which has also been used for the validation of thermal ... -
Hot spot detection in integrated circuits laterally accessing to the substrate
Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel (2010)
Text en actes de congrés
Accés obertThermal management of nano estructures requires the use of temperature monitoring strategies. In this work we expose a strategy bases on sensing the heat-flux within the chip substrate with a probe-laser beam. As the beam ... -
Hot spot detection in integrated circuits laterally accessing to their substrate using a laser beam
Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel (IEEE Computer Society Publications, 2010)
Text en actes de congrés
Accés obertIn this paper we present an electro-thermal coupling simulation technique for RF circuits. The proposed methodology takes advantage of well established tools for frequency translating circuits in order to significantly ... -
Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect
Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel; Mestres, Narcís (2010)
Article
Accés obertThis Letter presents a solution for locating hot spots in active integrated circuits (IC) and devices. This method is based on sensing the phase lag between the power periodically dissipated by a device integrated in an ... -
Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography
León, J.; Perpiñà, Xavier; Altet Sanahujes, Josep; Vallvehi, Miquel; Jordà, Xavier (2013-02-05)
Article
Accés restringit per política de l'editorialThis paper combines the infrared lock-in thermography (IR-LIT) and heterodyne excitation techniques to detect high-frequency capacitive currents due to intradie electrical coupling between microelectronic devices or more ...