• Estimation of thickness of hydrothermal degraded layer in 3Y-TZP by x-ray diffraction 

      García Marro, Fernando; Armas Sancho, Zamir de; Horwat, David; Anglada Gomila, Marcos Juan (2010)
      Comunicació de congrés
      Accés restringit per política de l'editorial
      A method is present for estimating the thickness of monoclinic layer formed by hydrothermal degradation of zirconia doped with 3 mol % of yttria (3Y-TZP) by means of X-ray diffraction at different incidence angles. The ...
    • High hardness, low Young's modulus and low friction of nanocrystalline ZrW2 Laves phase and Zr1-xWx thin films 

      Horwat, David; Jiménez Piqué, Emilio; Pierson, J.F.; Migot, A.; Dehmas, M.; Anglada Gomila, Marcos Juan (2012-04)
      Article
      Accés restringit per política de l'editorial
      Zr1−xWx nanocrystalline films of Zr-W solid solutions and ZrW2 Laves phase were synthesized by magnetron co-sputtering. Large values of the H/E ratio up to 0.09 are observed for grain sizes in the nanometer range along ...
    • High hardness, low youngs modulus and low friction of nanocrystalline ZrW 2 laves phase and Zr 1-xW x thin films 

      Horwat, David; Jiménez Piqué, Emilio; Pierson, J.F.; Migot, S.; Dehmas, M.; Anglada Gomila, Marcos Juan (2012)
      Article
      Accés restringit per política de l'editorial
      Zr1−xWx nanocrystalline films of Zr-W solid solutions and ZrW2 Laves phase were synthesized by magnetron co-sputtering. Large values of the H/E ratio up to 0.09 are observed for grain sizes in the nanometer range along ...
    • Structural and mechanical properties of Zr1-x Mox thin films: from the nano-crystalline to the amorphous state 

      Borroto-Ramírez, Alejandro; Bruyère, Sthepanie; Thurieau, Nicolas; Gendarme, Christine; Jiménez Piqué, Emilio; Roa Rovira, Joan Josep; Pierson, Jean Fronçois; Mücklich, Franck; Horwat, David (2017-12-30)
      Article
      Accés restringit per política de l'editorial
      Zr1-xMox thin films were synthesized on glass substrates by co-sputtering molybdenum and zirconium targets in the presence of argon with x in the 0.32–0.95 range. From X-ray diffraction analyses and transmission electron ...