Exploració per autor "Ergin, Oguz"

Ara es mostren els items 10-11 de 11

    • Reducing soft errors through operand width aware policies 

      Ergin, Oguz; Unsal, Osman Sabri; Vera Rivera, Francisco Javier; González Colás, Antonio María (2009-09)
      Article
      Accés obert
      Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. ...

    • Refueling: Preventing wire degradation due to electromigration 

      Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María; Tschanz, James W. (2008-12)
      Article
      Accés obert
      Electromigration is a major source of wire and via failure. Refueling undoes EM for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits EM's self-healing effect by balancing ...