Exploració per autor "Ergin, Oguz"

Ara es mostren els items 8-11 de 11

    • Impact of parameter variations on circuits and microarchitecture 

      Unsal, Osman Sabri; Tschanz, James W.; Bowman, Keith; De, Vivek; Vera Rivera, Francisco Javier; González Colás, Antonio María; Ergin, Oguz (2006-12)
      Article
      Accés obert
      Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace ...

    • MoRS: An approximate fault modelling framework for reduced-voltage SRAMs 

      Yuksel, Ismail Emir; Salami, Behzad; Ergin, Oguz; Unsal, Osman Sabri; Cristal Kestelman, Adrián (2022-06)
      Article
      Accés obert
      On-chip memory (usually based on Static RAMs-SRAMs) are crucial components for various computing devices including heterogeneous devices, e.g, GPUs, FPGAs, ASICs to achieve high performance. Modern workloads such as Deep ...

    • Reducing soft errors through operand width aware policies 

      Ergin, Oguz; Unsal, Osman Sabri; Vera Rivera, Francisco Javier; González Colás, Antonio María (2009-09)
      Article
      Accés obert
      Soft errors are an important challenge in contemporary microprocessors. Particle hits on the components of a processor are expected to create an increasing number of transient errors with each new microprocessor generation. ...

    • Refueling: Preventing wire degradation due to electromigration 

      Abella Ferrer, Jaume; Vera Rivera, Francisco Javier; Unsal, Osman Sabri; Ergin, Oguz; González Colás, Antonio María; Tschanz, James W. (2008-12)
      Article
      Accés obert
      Electromigration is a major source of wire and via failure. Refueling undoes EM for bidirectional wires and power/ground grids-some of a chip's most vulnerable wires. Refueling exploits EM's self-healing effect by balancing ...