Ara es mostren els items 9-16 de 16

    • Quantification of dissipation and deformation in ambient atomic force microscopy 

      Santos Hernández, Sergio; Gadelrab,, K.; Barcons Xixons, Víctor; Stefancich, M.; Chiesa, Matteo (2012-07-20)
      Article
      Accés restringit per política de l'editorial
      A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the ...
    • Quantification of van der Waals forces in bimodal and trimodal AFM 

      Santos, Sergio; Gadelrab, Karim Raafat; Elsherbiny, Lamiaa; Drexler, Xavier; Olukan, Tuza; Font Teixidó, Josep; Barcons Xixons, Víctor; Chiesa, Matteo (2023-05-28)
      Article
      Accés restringit per política de l'editorial
      The multifrequency formalism is generalized and exploited to quantify attractive forces, i.e., van der Waals interactions, with small amplitudes or gentle forces in bimodal and trimodal atomic force microscopy (AFM). The ...
    • Should humans work? 

      Santos Hernández, Sergio; Kissamitaki, Martisa; Chiesa, Matteo (2020-02-01)
      Article
      Accés obert
      Should humans work? A simple question at a time when the advent of AI, automation and robotics claims a privileged position in the future of work. The question is perplexing and confusing however once we enquire into the ...
    • Single cycle and transient force measurements in dynamic atomic force microscopy 

      Gadelrab, Karim Raafat; Santos, Sergio; Font Teixidó, Josep; Chiesa, Matteo (2013-11-21)
      Article
      Accés obert
      The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments ...
    • Single-cycle atomic force microscope force reconstruction: Resolving time-dependent interactions 

      Santos Hernández, Sergio; Gadelrab, Karim Raafat; Font Mateu, Josep; Chiesa, Matteo (2013-08)
      Article
      Accés obert
      Here, we enhance the capabilities of the atomic force microscope (AFM) to show that force profiles can be reconstructed without restriction by monitoring the wave profile of the cantilever during a single oscillation ...
    • Spatial horizons in amplitude and frequency modulation atomic force microscopy 

      Font Teixidó, Josep; Santos Hernández, Sergio; Barcons Xixons, Víctor; Thomson, Neil H.; Verdaguer, Albert; Chiesa, Matteo (2012-01-26)
      Article
      Accés obert
      In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation (AM and FM) atomic force ...
    • Subharmonic excitation in amplitude modulation atomic force microscopy in the presence of adsorbed water layers 

      Santos Hernández, Sergio; Barcons Xixons, Víctor; Verdaguer, Albert; Chiesa, Matteo (American Institute of Physics (AIP), 2011-12-02)
      Article
      Accés obert
      In ambient conditions, nanometric water layers form on hydrophilicsurfaces covering them and significantly changing their properties and characteristics. Here we report the excitation of subharmonics in amplitude modulation ...
    • The Mendeleev-Meyer force project 

      Santos Hernández, Sergio; Lai, Chia-Yun; Amadei, Carlo Alberto; Gadelrab, Karim Raafat; Tang, Tzu-Chieh; Verdaguer Prats, Albert; Barcons Xixons, Víctor; Font Teixidó, Josep; Colchero, Jaimer; Chiesa, Matteo (2016-10-28)
      Article
      Accés obert
      Here we present the Mendeleev–Meyer Force Project which aims at tabulating all materials and substances in a fashion similar to the periodic table. The goal is to group and tabulate substances using nanoscale force footprints ...