Exploració per autor "Shen, Yongxing"
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Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations
Shen, Yongxing; Barnett, David M.; Pinsky, Peter M. (2008)
Article
Accés obertKelvin probe force microscopy KPFM is designed for measuring the tip-sample contact potential differences by probing the sample surface, measuring the electrostatic interaction, and adjusting a feedback circuit. However, ...